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SEM image of the 0.5 wt. % SiO2/PMMA composite.
The space charge relaxation (PWP method) in the pure PMMA after the termination of electron beam irradiation.
The reducing amplitude of the normalized entrance peaks of PWP measurements in the irradiated nano/PMMA samples.
The statistical average tree-liked trace lengths with confidence interval (95% confidence level) in pure and doped PMMA samples with Al2O3 and SiO2 with various weight proportions.
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