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Structural, electronic, and magnetic behavior of two dimensional epitaxial Fe3O4/TiN/Si(100) system
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10.1063/1.4802235
/content/aip/journal/apl/102/15/10.1063/1.4802235
http://aip.metastore.ingenta.com/content/aip/journal/apl/102/15/10.1063/1.4802235

Figures

Image of FIG. 1.
FIG. 1.

RHEED images taken along [001] and [011] azimuths of Si(100): (a) treated Si substrate, (b) TiN deposited at 750 °C, (d) F400 sample, (f) F500 sample, and (h) F600 sample. (c), (e), (g), and (i) show the AFM images of respective samples.

Image of FIG. 2.
FIG. 2.

X-ray diffraction patterns of all samples in θ-2θ mode. Inset shows the FWHM of Fe3O4 (400) peak. Peak marked by “*” is from Si substrate, also reported previously (Ref. 8 ).

Image of FIG. 3.
FIG. 3.

Experimental (coloured line) and simulated (black line) specular XRR profiles for the three samples. Inset shows the layer-model used for simulation.

Image of FIG. 4.
FIG. 4.

Raman spectra of all samples recorded at room temperature. Lorentzian line shape fitting for the T2g and A1g modes are shown in the insets.

Image of FIG. 5.
FIG. 5.

Magnetization vs temperature (ZFC-FC) curves recorded at applied field of 200 Oe for (a) F400 sample, (b) F500 sample, and (c) F600 sample; corresponding insets show the dM/dT curves. (d) In-plane M-H measurements of all samples at room temperature.

Tables

Generic image for table
Table I.

Simulation results of specular XRR measurements.

Generic image for table
Table II.

Fitting line shape parameters of A1g and T2g modes obtained for F400, F500, and F600 samples.

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/content/aip/journal/apl/102/15/10.1063/1.4802235
2013-04-17
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Structural, electronic, and magnetic behavior of two dimensional epitaxial Fe3O4/TiN/Si(100) system
http://aip.metastore.ingenta.com/content/aip/journal/apl/102/15/10.1063/1.4802235
10.1063/1.4802235
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