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Optical control of individual carbon nanotube light emitters by spectral double resonance in silicon microdisk resonators
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View: Figures


Image of FIG. 1.
FIG. 1.

(a) Scanning electron micrograph of an as-fabricated silicon microdisk. (b) PL spectra of a microdisk with a diameter of 2.93 μm under resonant excitation (red, ) and off-resonant excitation (green, ). Blue curve is a PL spectrum of the unpatterned substrate ( nm). (c) PLE spectra of the microdisk (red) and unpatterned substrate (blue), obtained by integrating emission spectra over a spectral window of 1 nm centered around 1055 nm. (d) PLE map. In (b)–(d), PL counts are normalized to P = 1 mW to account for laser power changes with wavelength. (e) Reflectivity image of the microdisk measured in (b)–(g). (f) and (g) PL images of the microdisk with horizontally and vertically polarized excitation, respectively. Images are obtained by integrating PL over a spectral window of 5 nm centered around 1055 nm. The polarization directions are schematically shown at the top-right corners of the images. The scale bars in (e)–(g) are 2 μm.

Image of FIG. 2.
FIG. 2.

(a) PL spectra of microdisks with diameters from 2.97 μm to 3.25 μm after nanotube deposition. (b) Assignments of microdisk resonator modes. Lines show calculated wavelengths of fundamental TE modes using an approximated analytic model with no adjustable parameters. Numbers above the lines indicate mode index. Experimental data are obtained from spectra including those shown in (a). Filled circles are resonances identified as fundamental TE modes. Those assigned to fundamental TM modes are marked by open circles. Unassigned modes, which include higher order modes, are indicated by crosses.

Image of FIG. 3.
FIG. 3.

(a) Scanning electron micrograph of a suspended nanotube attached to a microdisk. (b) Reflectivity image of a device measured in (c)–(f). The disk diameter is 3.00 μm. and P = 0.2 mW are used. Blue and red dots indicate the positions at which the data in (c),(d) and (e),(f) are taken, respectively. The white box shows the position of the suspended nanotube. The scale bars in (a) and (b) are 2 μm. (c) Directly measured PL spectrum of the suspended nanotube for . (d) PLE map obtained by direct measurement of the suspended nanotube. (e) PL spectrum of nanotube emission coupled to the microdisk for (red solid line) and 827 nm (red broken line). (f) PLE map of nanotube emission coupled to the microdisk. In (c),(d) and (e),(f), the PL counts are normalized to laser powers of 10 μW and 500 μW, respectively. In (c),(d), laser is linearly polarized parallel to the nanotube, while in (e),(f), it is polarized along the radial direction of the disk.

Image of FIG. 4.
FIG. 4.

(a) A PL image of Si emission coupled to a WGM, taken with and P = 1.5 mW. To construct this image, the spectra have been integrated from 1171 nm to 1175 nm. (b) High resolution PL spectrum of nanotube emission coupled to a WGM. Blue dots are data and lines are Lorentzian fits as explained in the text. The peak values obtained from the fits are plotted in (c) and (d). (c) An image of CNT emission coupled toaWGM. (d) An image of direct CNT emission. For these images, and P = 0.3 mW with circular polarization are used. The scale bars in the images are 2 μm.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Optical control of individual carbon nanotube light emitters by spectral double resonance in silicon microdisk resonators