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Spontaneous formation of InGaN nanowall network directly on Si
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10.1063/1.4803017
/content/aip/journal/apl/102/17/10.1063/1.4803017
http://aip.metastore.ingenta.com/content/aip/journal/apl/102/17/10.1063/1.4803017
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

SEM top view. The red dotted lines show the hexagonal symmetry.

Image of FIG. 2.
FIG. 2.

HRXRD ω-2θ scan in the vicinity of the (0002) Bragg reflection. Insets: SAED pattern viewed along the III-N zone axis and schematic drawing of the nanowalls with fluctuating In composition.

Image of FIG. 3.
FIG. 3.

(a) TEM HAADF image and (b) HRTEM image of the InGaN/SiNx/Si interfaces viewed along the III-N zone axis.

Image of FIG. 4.
FIG. 4.

(a) PL spectrum and (b) I-V curve measured between two Al top contacts at room temperature.

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/content/aip/journal/apl/102/17/10.1063/1.4803017
2013-04-29
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Spontaneous formation of InGaN nanowall network directly on Si
http://aip.metastore.ingenta.com/content/aip/journal/apl/102/17/10.1063/1.4803017
10.1063/1.4803017
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