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SEM top view. The red dotted lines show the hexagonal symmetry.
HRXRD ω-2θ scan in the vicinity of the (0002) Bragg reflection. Insets: SAED pattern viewed along the III-N zone axis and schematic drawing of the nanowalls with fluctuating In composition.
(a) TEM HAADF image and (b) HRTEM image of the InGaN/SiNx/Si interfaces viewed along the III-N zone axis.
(a) PL spectrum and (b) I-V curve measured between two Al top contacts at room temperature.
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