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Top oxide thickness dependence of remote phonon and charged impurity scattering in top-gated graphene
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10.1063/1.4804432
/content/aip/journal/apl/102/18/10.1063/1.4804432
http://aip.metastore.ingenta.com/content/aip/journal/apl/102/18/10.1063/1.4804432
/content/aip/journal/apl/102/18/10.1063/1.4804432
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/content/aip/journal/apl/102/18/10.1063/1.4804432
2013-05-07
2014-10-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Top oxide thickness dependence of remote phonon and charged impurity scattering in top-gated graphene
http://aip.metastore.ingenta.com/content/aip/journal/apl/102/18/10.1063/1.4804432
10.1063/1.4804432
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