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Pyroelectric electron emission from nanometer-thick films of PbZrxTi1−xO3
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19.See supplementary material at http://dx.doi.org/10.1063/1.4806973 for I-V measurements at elevated steady state temperatures, Fowler-Nordheim plots of field emission from PZT films, and an estimate of the field enhancement factor from experiment. [Supplementary Material]
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/content/aip/journal/apl/102/19/10.1063/1.4806973
2013-05-13
2014-12-18

Abstract

We report pyroelectric emission from PbZrTiO (PZT) thin films on nanometer-sharp tips. The epitaxial PZT films are 30 nm thick and grown directly on single-crystal silicon tips. Pyroelectric emission occurs for heating rates of ≥50 °C/min in a 20 V/m external field. The emission current is a maximum of 240 nA when the heating rate is 100 °C/min and the electric field strength is ≥6.7 V/m. The emitted charge is ∼7% of that expected for a perfect thin film emitter of epitaxial PbZrTiO. We calculate that pyroelectric emission can occur without an applied field if the heating rate exceeds 4.0 × 10 °C/min.

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Scitation: Pyroelectric electron emission from nanometer-thick films of PbZrxTi1−xO3
http://aip.metastore.ingenta.com/content/aip/journal/apl/102/19/10.1063/1.4806973
10.1063/1.4806973
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