Full text loading...
X-ray diffractogram of a Fe:STO film grown epitaxially on a Nb:STO (001) single crystal substrate. The inset shows a high resolution X-ray diffractogram of the same specimen around the (002) reflection.
Semi-logarithmic plot (the inset in the upper left corner shows a linear plot) of I-V characteristics measured in sweep mode from −3 to +3 V (blue circles) and subsequently from +3 back to −3 V (red squares), or in alternating polarity mode (black squares). The arrows indicate the sequence of the sweep mode measurement. Currents to the left (right) of the minimum current points are negative (positive), and the voltages at the minimum current points are the OCVs. The inset in the lower right corner shows a schematic illustration of the device structure (the layers thicknesses are not to scale).
The voltage measured across a Fe:STO/Nb:STO junction during sequential charging and discharging cycles at −1.5 and +1.5 V, respectively.
Article metrics loading...