banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Single-shot 35 fs temporal resolution electron shadowgraphy
Rent this article for
View: Figures


Image of FIG. 1.
FIG. 1.

Cartoon scheme of the experiment.

Image of FIG. 2.
FIG. 2.

Two different shots (laser on) of the beam on the detector after it has been streaked by the RF deflector. The jitter in the TOA appears in the different time of appearance of the scattered region, but does not affect the temporal resolution of the shadowgraph. In the inset, we show the unstreaked beam size on the same scale which is equivalent to 35 fs rms. On the right, we plot a lineout of the pixel intensities along the AB line to illustrate the sharp transition in the signal.

Image of FIG. 3.
FIG. 3.

(a) and (b) Time-resolved shadowgraph for two different fluences. (c) Simulation results comparing point charge (left) and extended charge (right) distributions. (d) Comparing instantaneous (left) and thermal (right) charge emission models.

Image of FIG. 4.
FIG. 4.

(a) Square of hole radius vs. incident laser fluence. The right axis shows the effective charge required in the model to reproduce the data. The red curve indicates the behavior expected for photoemission from Cu using 800 nm photons. The blue line indicates a power law fit to the data showing significant space charge induced saturation. (b) Hole radius vs. time. The data (green) are in good agreement with a thermal emission model (blue). The results from the instantaneous emission model (red) are also shown.


Article metrics loading...


Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Single-shot 35 fs temporal resolution electron shadowgraphy