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TEM images of Ni films on (a) In-face and (b) N-face InN with SAD of (c) In-face and (d) N-face InN for as-deposited samples. Each diffraction pattern consists of a set of diffraction spots from the single crystalline InN and diffraction rings from the polycrystalline Ni film.
GIXRD patterns collected for (a) In-face Ni/InN samples and (b) N-face Ni/InN samples.
TEM images of Ni films annealed at 673 K for 1 h on (a) In-face and (b) N-face InN along with SAD of the (c) In-face and (d) N-face InN samples. Diffraction spots are from InN, and rings are from the Ni-bearing layers.
HAADF images for Ni films annealed for 1 h at 673 K on (a) In-face and (b) N-face InN highlight the difference in microstructure.
XEDS spectra from annealed Ni films reveal only a Ni peak for the In-face sample while N and In peaks are also observed for the N-face sample.
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