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Integration of on-chip field-effect transistor switches with dopantless Si/SiGe quantum dots for high-throughput testing
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10.1063/1.4807768
/content/aip/journal/apl/102/21/10.1063/1.4807768
http://aip.metastore.ingenta.com/content/aip/journal/apl/102/21/10.1063/1.4807768
/content/aip/journal/apl/102/21/10.1063/1.4807768
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/content/aip/journal/apl/102/21/10.1063/1.4807768
2013-05-27
2015-05-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Integration of on-chip field-effect transistor switches with dopantless Si/SiGe quantum dots for high-throughput testing
http://aip.metastore.ingenta.com/content/aip/journal/apl/102/21/10.1063/1.4807768
10.1063/1.4807768
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