No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
High speed atomic force microscopy enabled by a sample profile estimator
2. D. Y. Abramovitch, S. B. Andersson, L. Y. Pao, and G. Schitter, in Proceedings American Control Conference (2007), p. 3488.
4. G. E. Fantner, G. Schitter, J. H. Kindt, T. Ivanov, K. Ivanova, R. Patel, N. Holten-Andersen, J. Adams, P. J. Thurner, I. W. Rangelow, and P. K. Hansma, Ultramicroscopy 106, 881–887 (2006).
13. P. Huang and S. B. Andersson, in Proceedings IFAC Symposium on Mechatronics (2013), p. 153.
Article metrics loading...
Full text loading...
Most read this month