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High speed atomic force microscopy enabled by a sample profile estimator
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10.1063/1.4808211
/content/aip/journal/apl/102/21/10.1063/1.4808211
http://aip.metastore.ingenta.com/content/aip/journal/apl/102/21/10.1063/1.4808211
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Imaging of a linear grating. (a) Standard raster scan at 1 line/s, 512 pixel resolution (8.5 min). (b) image and (c) height signal and 24.41 lines/s, 512 pixel resolution. (21 s).

Image of FIG. 2.
FIG. 2.

Imaging of lambda DNA. (a) Standard raster scan at 1 line/s, 512 pixel resolution (8.5 min). (b) image and (c) height signal and 24.41 lines/s, 512 pixel resolution. (21 s).

Image of FIG. 3.
FIG. 3.

Raster scan (1 line/s) of the sample in Fig. 2 after high speed imaging, showing no sample damage.

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/content/aip/journal/apl/102/21/10.1063/1.4808211
2013-05-31
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: High speed atomic force microscopy enabled by a sample profile estimator
http://aip.metastore.ingenta.com/content/aip/journal/apl/102/21/10.1063/1.4808211
10.1063/1.4808211
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