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Iron related donor-like defect in zinc oxide
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10.1063/1.4809941
/content/aip/journal/apl/102/23/10.1063/1.4809941
http://aip.metastore.ingenta.com/content/aip/journal/apl/102/23/10.1063/1.4809941

Figures

Image of FIG. 1.
FIG. 1.

DLTS spectra from samples A (a) and B (b) after different annealing processes using a rate window of (640 ms). A reverse bias voltage of −3 V and filling pulse voltage of 3 V have been employed. C represents the reverse bias capacitance, N is the carrier concentration, and is the amplitude of the capacitance transient.

Image of FIG. 2.
FIG. 2.

Measured impurity concentrations using SIMS and the concentrations of E2, E3, and E4 for the three different samples (A, B, and C).

Image of FIG. 3.
FIG. 3.

The E2 concentration after annealing in oxygen as a function of the total Fe concentration. The fitted curve indicates that [E2] increases proportionally with [Fe] (brackets denote concentration values).

Tables

Generic image for table
Table I.

E2 and E4 concentrations after O-rich and Zn-rich annealing treatment, respectively, for the samples A, B, and C.

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/content/aip/journal/apl/102/23/10.1063/1.4809941
2013-06-10
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Iron related donor-like defect in zinc oxide
http://aip.metastore.ingenta.com/content/aip/journal/apl/102/23/10.1063/1.4809941
10.1063/1.4809941
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