Full text loading...
Experimental data of and Δ measured at various angle of incidence. Inset: Schematic view of the one layer model. Legend: Numbers indicate the angle of incidence.
Difference between measured and the fits of the two models. A significant improvement in the quality of the fit is obtained through the two-layer model, especially near the E1 critical point of silicon(3.4 ev). Legend: T and O indicate two-layer and one-layer model respectively. Numbers indicate the angle of incidence.
Real and imaginary parts of the dielectric functions of the top layer SrTiO3 (red), second layer SrTiO3 (blue), and bulk SrTiO3 (green). Inset: (a)Fit of the optical indirect band gap for the bulk. (b) Fits of the optical indirect band gaps for both top and second layers of SrTiO3. (c) Fits of the direct band gaps for top layer and bulk SrTiO3.
Penetration depth of the top layer. The red line indicates the thickness of the top layer.
Article metrics loading...