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(a) High angle x-ray diffraction data on sample S1(nominal structure: MgO/Fe(2 nm)/Fe-N(40 nm)) and S2(nominal structure: MgO/Fe(20 nm)/Fe-N(40 nm)). The peak labeled by (*) comes from the CuKα2. (b) Gaussian fitted Rocking curves measured on Fe16N2 (002) and (004) of sample S1, respectively. (c) Grazing incident x-ray diffraction with scattering vector aligned along MgO (2 0 0) on sample S1 and S2. The shift of the peak position upon underlayer thickness increase suggests the tensile strain developed at the bottom interface of the films. Dashed lines are guides to the eye. (d) Φ scan of Fe16N2 with scattering vector aligned on 2θ = Fe16N2 (220) of sample S1. The inset shows the zoom-in look of one peak as outlined.
(a) and (b) show the XRR data (red open squares) and corresponding fit (black lines) from the sample S1 and S2, respectively. (c) and (d) show the PNR data (open squares and circles) and fit (lines) of sample S1 and S2. The spin asymmetry of both samples is shown in (e) and (f).
(a)–(c) show the electron SLD, nuclear SLD, and saturation magnetic induction (Bs) depth profiles, which yield the fit lines in Fig. 2 for sample S1. (d)–(f) show the electron SLD, nuclear SLD, and saturation magnetic induction (Bs) depth profiles, which yields the fit in Fig. 2 for sample S2.
(a) Bs depth profile according to the fit in Fig. 2 , depth of the near substrate layer (t), and the maximum saturation magnetic induction (Bmax) is defined as outlined. (b) Contour plot of the relative changes in the fit error (u − u0) versus t and Bmax.
Summary of fitted values of thickness ESLD, NSLD of each layer according to PNR and XRR analyses. The nominal values are shown in parentheses. The average Bs of both samples were measured by VSM and shown in the table as well (the calculated Bs according to PNR MSLD profile is shown in parentheses).
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