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Schematic configuration of prepared samples: (a) LCMO single layer (sample A), (b) LCMO/IO bilayer (sample B), (c) LCMO/nanodots (sample C), and (d) LCMO/nanodots/IO sandwich structure (sample D).
AFM image for sample C.
Fe2p XPS spectra for sample D.
Magnetization as a function of temperature for samples A, B, C, and D measured at the applied field of 0.3 T.
Resistance as a function of temperature for sample A (a), sample B (b), and sample D (c) at the applied magnetic fields of 0, 2, and 5 T. In (a), the upper inset shows the normalized R-T curves of sample A, and the lower inset shows the MR ratio of sample A at 5 T. The inset in (b) shows the R-T curves of the IO single layer film. The inset in (c) shows the MR ratio of sample D at 5 T.
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