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SEM picture of the solution grown FF microtubes used for the resonance studies. Sufficiently small nanotubes could be grown in the same experiment. The inset shows SEM picture of the vertical tube with slightly asymmetric opening.
Schematic of the FF tube arrangement on the rigid substrate. AFM cantilever is used to excite piezoelectric resonances and to measure induced vibrations as a function of frequency. Red arrows are used to highlight inhomogeneous distribution of electric field that helps to induce bending resonances in the system.
Piezoelectric resonances excited in the FF microtube of 885 μm long and 13 μm in diameter in a cantilever configuration. Solid line represents the resonance structure for the AFM tip located in the middle. Dotted line is the example of the resonance peaks for the AFM tip close to the support. Table in the set summarizes resonance frequencies and quality factors for both configurations.
Piezoelectric resonance of a FF microtube (277 μm long and 13 μm in diameter) in both DFL and LF modes. The inset shows extracted resonance frequencies and quality factors.
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