1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Ambient condition laser writing of graphene structures on polycrystalline SiC thin film deposited on Si wafer
Rent:
Rent this article for
USD
10.1063/1.4793520
/content/aip/journal/apl/102/7/10.1063/1.4793520
http://aip.metastore.ingenta.com/content/aip/journal/apl/102/7/10.1063/1.4793520
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD spectra and SEM micrographs of a 3 C-SiC thin film grown on Si (111): (a) XRD spectra, (b) surface morphology, and (c) cross-section image.

Image of FIG. 2.
FIG. 2.

Raman spectra of as-grown 3 C-SiC on Si (111), laser-illuminated spot on 3 C-SiC on Si (111), bare Si (111), and C60 powders. Inset shows the enlarged spectral region of the SiC phonons.

Image of FIG. 3.
FIG. 3.

SEM micrographs of 3 C-SiC grown on Si (111): (a) sample A, (b)sample B, and (c) sample C.

Image of FIG. 4.
FIG. 4.

SEM micrographs of laser-induced graphene from 3 C-SiC and corresponding Raman mapping images: (a) sample A, (b) sample B, and (c) sample C. Raman mapping range is 4 μm×4 μm with a spectral range of 2650–2750 cm−1.

Loading

Article metrics loading...

/content/aip/journal/apl/102/7/10.1063/1.4793520
2013-02-22
2014-04-16
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Ambient condition laser writing of graphene structures on polycrystalline SiC thin film deposited on Si wafer
http://aip.metastore.ingenta.com/content/aip/journal/apl/102/7/10.1063/1.4793520
10.1063/1.4793520
SEARCH_EXPAND_ITEM