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Transmission electron microscopy study of degradation in transparent indium tin oxide/Ag/indium tin oxide multilayer films
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10.1063/1.4812815
/content/aip/journal/apl/103/1/10.1063/1.4812815
http://aip.metastore.ingenta.com/content/aip/journal/apl/103/1/10.1063/1.4812815
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Figures

Image of FIG. 1.
FIG. 1.

(a) Resistivity, sheet resistance, (b) mobility, and carrier concentration of ITO/Ag/ITO multilayer electrodes as a function of annealing temperature. (c) Picture shows transparency of ITO/Ag/ITO multilayer electrodes with increasing annealing temperature. (d) Optical transmittance, (e) figure of merit value, and transmittance of ITO/Ag/ITO multilayer electrodes as a function of annealing temperature at 550 nm wavelength.

Image of FIG. 2.
FIG. 2.

Synchrotron X-ray scattering results obtained from ITO/Ag/ITO multilayer electrodes as a function of annealing temperature.

Image of FIG. 3.
FIG. 3.

(a) Cross-sectional TEM image and (b), (c), and (d) enlarged HRTEM image of as-deposited ITO/Ag/ITO multilayer electrode with the inset showing fast Fourier transformation pattern.

Image of FIG. 4.
FIG. 4.

(a) Cross-sectional TEM image and (b), (c), and (d) enlarged HRTEM image of 600 °C annealed ITO/Ag/ITO multilayer electrode with inset showing fast Fourier transformation pattern.

Image of FIG. 5.
FIG. 5.

XPS depth profile of the (a) as-deposited and (b) 600 °C annealed ITO/Ag/ITO multilayer electrodes. The inset shows the surface FESEM images of (a) as-deposited and (b) 600 °C annealed ITO/Ag/ITO multilayer electrodes.

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/content/aip/journal/apl/103/1/10.1063/1.4812815
2013-07-02
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Transmission electron microscopy study of degradation in transparent indium tin oxide/Ag/indium tin oxide multilayer films
http://aip.metastore.ingenta.com/content/aip/journal/apl/103/1/10.1063/1.4812815
10.1063/1.4812815
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