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Free-space coupled, ultralow-threshold Raman lasing from a silica microcavity
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View: Figures


Image of FIG. 1.
FIG. 1.

SEM images of (a) top and (b) oblique views of the deformed microtoroid used throughout this paper. (c) False-color representation of a TM-polarized mode at wavelength of 1550 nm. The white solid curve is the boundary of the cavity, and the red arrows show the directions of the electric fields. (d) Schematic diagram of the experimental setup for free-space excitation and collection. PLC: polarization controller, FC: fiber collimator, OL: objective lens, PR: photoreceiver, OSA: optical spectrum analyzer.

Image of FIG. 2.
FIG. 2.

Stimulated Raman scattering at 1639.63 nm from the deformed silica microtoroid excited at 1546.73 nm using free-space coupling. The wide spectrum peak between 1540 nm and 1570 nm is the spectral envelope of semiconductor laser. Inset: Raman lasing power collected in the 0° far-field direction as a function of the pump power for an excited TE mode with a factor of about 1.12 × 10.

Image of FIG. 3.
FIG. 3.

Experimental (black dots) and theoretical (red solid line) Raman laser thresholds of a deformed microtoroid as a function of the cavity factors. Inset (top): normalized free-space transmission spectrum with the factor of 1.12 × 10. Inset (bottom): microcavity-enhanced-scattering optical images, excited by a visible light laser.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Free-space coupled, ultralow-threshold Raman lasing from a silica microcavity