banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Temperature-dependence of the Hall coefficient of NdNiO3 thin films
Rent this article for
View: Figures


Image of FIG. 1.
FIG. 1.

(a) On-axis XRD around the 002 reflection of a 16.5 nm NdNiO film grown on (001) LaAlO. (b) Off-axis XRD of the same film at a tilt angle of Ψ = 45°, showing 011 reflections of film and substrate. The double peak of the LaAlO substrate is due to twinning. (c) Cross-section HAADF-STEM image. (d) Longitudinal resistivity of a 16.5 nm film as a function of temperature measured upon cooling and heating, respectively.

Image of FIG. 2.
FIG. 2.

(a) Time-dependence of the longitudinal resistance at different temperatures around . Shown is the percentage change from the value measured 5 min after the temperature has stabilized, upon cooling from room temperature (filled symbols) and heating from 10 K (open symbols), respectively. (b) Amount of drift, as defined in (a), after 5 h, as a function of temperature under cooling (blue filled circles) and heating (orange open triangles), respectively. (c) Raw data (dashed lines) as a function a magnetic field measured over 6 h of continuous field sweeps from −9 to 9 T at  = 80 K. Also shown is the drift-corrected (solid line).

Image of FIG. 3.
FIG. 3.

(a) Longitudinal resistivity and drift-corrected as a function of temperature. (b) Same as (a) but within a narrower range of temperatures to show the positive in the metallic region. (c) Seebeck coefficient as a function of temperature in the metallic phase. Measurements upon cooling (heating) are shown as circles (triangles).


Article metrics loading...


Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Temperature-dependence of the Hall coefficient of NdNiO3 thin films