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1.
1. Q. Meng, H. Dong, W. Hu, and D. Zhu, J. Mater. Chem. 21, 11708 (2011).
http://dx.doi.org/10.1039/c1jm10243e
2.
2. Y. Wen and Y. Liu, Adv. Mater. 22, 1331 (2010).
http://dx.doi.org/10.1002/adma.200901454
3.
3. T. W. Kelley, D. V. Muyres, P. F. Baude, T. P. Smith, and T. D. Jones, Mater. Res. Soc. Symp. Proc. 771, 169 (2003).
http://dx.doi.org/10.1557/PROC-771-L6.5
4.
4. H. Klauk, Chem. Soc. Rev. 39, 2643 (2010).
http://dx.doi.org/10.1039/b909902f
5.
5. C.-H. Wang, C.-Y. Hsieh, and J.-C. Hwang, Adv. Mater. 23, 1630 (2011).
http://dx.doi.org/10.1002/adma.201004071
6.
6. T. Matsushima, M. Yahiro, and C. Adachi, Appl. Phys. Lett. 91, 103505 (2007).
http://dx.doi.org/10.1063/1.2779240
7.
7. C. R. Newman, C. D. Frisbie, D. A. da Silva, J. L. Bredas, P. C. Ewbank, and K. R. Mann, Chem. Mater. 16, 4436 (2004).
http://dx.doi.org/10.1021/cm049391x
8.
8. G. Gelinck, P. Heremans, K. Nomoto, and T. D. Anthopoulos, Adv. Mater. 22, 3778 (2010).
http://dx.doi.org/10.1002/adma.200903559
9.
9. Y. Inoue, Y. Sakamoto, T. Suzuki, M. Kobayashi, Y. Gao, and S. Tokito, Jpn. J. Appl. Phys., Part 1 44, 3663 (2005).
http://dx.doi.org/10.1143/JJAP.44.3663
10.
10. R. C. Haddon, A. S. Perel, R. C. Morris, T. T. M. Palstra, A. F. Hebard, and R. M. Fleming, Appl. Phys. Lett. 67, 121 (1995).
http://dx.doi.org/10.1063/1.115503
11.
11. Th. B. Singh, N. Marjanovic, G. J. Matt, S. Günes, N. S. Sariciftci, A. M. Ramil, A. Andreev, H. Sitter, R. Schwödiauer, and S. Bauer, Org. Electron. 6, 105 (2005).
http://dx.doi.org/10.1016/j.orgel.2005.03.006
12.
12. T. D. Anthopoulos, B. Singh, N. Marjanovic, N. S. Sariciftci, A. M. Ramil, H. Sitter, M. Cölle, and D. M. de Leeuw, Appl. Phys. Lett. 89, 213504 (2006).
http://dx.doi.org/10.1063/1.2387892
13.
13. K. Itaka, M. Yamashiro, J. Yamaguchi, M. Haemori, S. Yaginuma, Y. Matsumoto, M. Kondo, and H. Koinuma, Adv. Mater. 18, 1713 (2006).
http://dx.doi.org/10.1002/adma.200502752
14.
14. M. Kitamura, Y. Kuzumoto, M. Kamura, S. Aomori, and Y. Arakawa, Appl. Phys. Lett. 91, 183514 (2007).
http://dx.doi.org/10.1063/1.2804004
15.
15. C.-Z. Zhou, F. Confalonieri, M. Jacquet, R. Perasso, Z.-G. Li, and J. Janin, Proteins 44, 119 (2001).
http://dx.doi.org/10.1002/prot.1078
16.
16. L.-L. Chua, J. Zaumseil, J.-F. Chang, E. C.-W. Ou, P. K.-H. Ho, H. Sirringhaus, and R. H. Friend, Nature 434, 194 (2005).
http://dx.doi.org/10.1038/nature03376
17.
17. L.-K. Mao, J.-C. Hwang, T.-H. Chang, C.-Y. Hsieh, L.-S. Tsai, Y.-L. Chueh, S. S.-H. Hsu, P.-C. Lyu, and T.-J. Liu, Org. Electron. 14, 1170 (2013).
http://dx.doi.org/10.1016/j.orgel.2013.02.010
18.
18. T. Jung, A. Dodabalapur, R. Wenz, and S. Mohapatra, Appl. Phys. Lett. 87, 182109 (2005).
http://dx.doi.org/10.1063/1.2117629
19.
19. S. Lee, B. Koo, J. Shin, E. Lee, H. Park, and H. Kim, Appl. Phys. Lett. 88, 162109 (2006).
http://dx.doi.org/10.1063/1.2196475
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/content/aip/journal/apl/103/23/10.1063/1.4841595
2013-12-06
2016-09-27

Abstract

A pentacene interlayer of 2 nm thick is inserted between fullerene (C) and the solution-based silk fibroin dielectric in C organic field-effect transistors (OFETs). The pentacene interlayer assists to improve crystal quality of the C layer, leading to the increase of field-effect mobility ( ) from 0.014 to 1 cm2 V−1 s−1 in vacuum. The value of the C OFET is further enhanced to 10 cm2 V−1 s−1 when the OFET is exposed to air in a relative humidity of 55%. Generation of mobile and immobile charged ions in solution-based silk fibroin in air ambient is proposed.

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/deliver/fulltext/aip/journal/apl/103/23/1.4841595.html;jsessionid=OOZ5hGFc02j6_URdKycWL3EI.x-aip-live-06?itemId=/content/aip/journal/apl/103/23/10.1063/1.4841595&mimeType=html&fmt=ahah&containerItemId=content/aip/journal/apl
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
/content/realmedia?fmt=ahah&adPositionList=
&advertTargetUrl=//oascentral.aip.org/RealMedia/ads/&sitePageValue=apl.aip.org/103/23/10.1063/1.4841595&pageURL=http://scitation.aip.org/content/aip/journal/apl/103/23/10.1063/1.4841595'
x100,x101,x102,x103,
Position1,Position2,Position3,
Right1,Right2,Right3,