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Electron temperature dependence of the electron-phonon coupling strength in double-wall carbon nanotubes
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10.1063/1.4816055
/content/aip/journal/apl/103/4/10.1063/1.4816055
http://aip.metastore.ingenta.com/content/aip/journal/apl/103/4/10.1063/1.4816055
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Time evolution of the photo-excitation spectra for different time delays showing the changes in the electron distribution due to the absorbed energy from the IR pump pulse. (Inset) Photo-excitation of the electrons from below the Fermi level to the continuum.

Image of FIG. 2.
FIG. 2.

(a) F-D distribution for two different electron temperatures, , 300 K and 2000 K. (b) Electron distribution above the Fermi level probed at 570 fs after the excitation and modeled as the difference Δ(E,T) of two F-D distributions ( in log scale) with an elevated of 2000 ± 100 K and 300 K. (c) Temporal evolution of the electron energy density () fitted with an exponent with a time constant  = 1.34 ± 0.85 ps, restricted at >500 fs delays, where the internal thermalization of the electronic system is established. The error bars represent the uncertainty in the determination of the internal energy of the electronic system calculated using the temperatures obtained from the F-D fit of the excitation spectrum.

Image of FIG. 3.
FIG. 3.

Temporal evolution of the electron, , and lattice, , temperatures based on the TTM (red lines). The measured cooling rate of the electronic system is shown with black dots. The error bars represent the errors of the fit of the F-D function to the photo-excited electron distribution above .

Image of FIG. 4.
FIG. 4.

Energy transfer rate () from electrons to lattice as a function of their temperature difference fitted to a linear relation of (solid red line; 95% confidence interval as purple shaded area) with the slope as an adjustable parameter. The vertical error bars are related to the error of the fitted (), while the horizontal error bars are estimations. The blue dashed line shows the dependence on the fifth power of the temperature (95% confidence intervals in yellow dotted-dashed lines).

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/content/aip/journal/apl/103/4/10.1063/1.4816055
2013-07-23
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electron temperature dependence of the electron-phonon coupling strength in double-wall carbon nanotubes
http://aip.metastore.ingenta.com/content/aip/journal/apl/103/4/10.1063/1.4816055
10.1063/1.4816055
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