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(a) Unit cell of the beam steerer. A 3 μm slit was inscribed in a 200 nm thick copperplate. The copper was embedded in 60 μm thick BCB. (b) Retrieved effective refractive index n and transmission T versus frequency for different inner ring radii r in . r in was increased in 1 μm steps from 18 μm (black line) to 25 μm (yellow-gray line, highest n). (c) Refractive index versus the inner ring radius r in at the design frequency 1.3 THz (black square) as well as 1.2 THz (red circle) and 1.4 THz (blue triangle). Straight line shows fit with fixed slope of . (d) Excerpt of a microscope picture of the fabricated beam steerer. The ring radius increases along the x-axis from left to right.
(a) Electric field of a 1.3 THz beam deflected from a double-layer beam steerer. The beam was deflected by –6.1°. (b) Spectral amplitude transmission of a single- and double-layer beam steerer for two different orthogonal polarizations in x- and y-direction.
(a) Measured (symbols) and numerically calculated (lines) lateral THz field intensity distributions in dependence on the distance z from a single-layer beam deflector at 1.3 THz for a y-polarized beam. x = 0 corresponds to the center position of the non-deflected reference beam. (b) Dependence of the beam center position on the distance z from the beam steerer as derived from (a). Symbols correspond to measured data and lines to numerical data. The blue triangles and line correspond to deflection from a beam steerer that was rotated by 180° around the z-axis. Black squares and line indicate a reference measurement without beam deflector.
Beam center position versus distance z from a double-layer beam steerer for (a) y-polarization and (b) x-polarization.
Measured and numerically calculated spectral dependence of the beam deflection angle for x- and y-polarized incident beams in the case of a (a) single-layer beam steerer and (b) double-layer beam steerer.
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