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The typical STT-MRAM structure. F1,2,3 are ferromagnetic layers, and NM, I, and AFM are the non-magnetic, insulator, and antiferromagnetic layers, respectively. The positive current density is defined from the bottom to the top, and x-axis is the long axis of the ellipse.
Switching current density of (a) AP to P state (b) P to AP state dependence of the IEC energy J 1 for various exchange stiffness constant A ex (1.0, 2.0, and 3.0 × 1011 J/m) for collinear polarizer layer. (c) and (d) The same plots for the non-collinear polarizer layer with 10° of tilting angle.
Time dependence normalized magnetization x-component (Mx /Ms ) for each layer for A ex = 3.0 × 1011 J/m for the collinear polarizer case. (a) J 1 = −2.0 × 10−3 J/m2 with the switching current density of −3.59 × 1011 A/m2 and (b) J 1 = −2.0 × 10−4 J/m2 the collinear polarizer case with the switching current density of −3.16 × 1011 A/m2.
(a) Time dependence normalized magnetization x-component (Mx /Ms ) for each layer for A ex = 3.0 × 1011 J/m and J 1 = −2.0 × 10−4 J/m2 for the non-collinear polarizer case with tilting angle of 10° for the switching current density of 1.56 × 1011 A/m2. (b) The time dependent magnetization angle from positive x-axis for F1 and F2 layers.
Fast Fourier Transform of normalized magnetization y-component (My /Ms ) for J 1 = − 2.0 × 10−4 and × 10−3 J/m2 cases for F1 and F2 layers. The solid lines are for J 1 = −2.0 × 10−4 J/m2 and dashed lines are J 1 = −2.0 × 10−3 J/m2, respectively.
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