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Optomechanical effects of two-level systems in a back-action evading measurement of micro-mechanical motion
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10.1063/1.4816428
/content/aip/journal/apl/103/5/10.1063/1.4816428
http://aip.metastore.ingenta.com/content/aip/journal/apl/103/5/10.1063/1.4816428
/content/aip/journal/apl/103/5/10.1063/1.4816428
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/content/aip/journal/apl/103/5/10.1063/1.4816428
2013-07-29
2014-10-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Optomechanical effects of two-level systems in a back-action evading measurement of micro-mechanical motion
http://aip.metastore.ingenta.com/content/aip/journal/apl/103/5/10.1063/1.4816428
10.1063/1.4816428
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