Full text loading...
(a) X-ray diffraction pattern of the LCMO/STO/PMN-PT heterostructure; (b) rocking curves taken around LCMO (002) diffraction for samples with and without STO buffer layer; and surface morphologies of LCMO films with (c) and without (d) STO buffer layer.
(a) P–E hysteresis loops for PMN-PT substrate at different temperatures; (b) in-plane strain εxx of LCMO film vs. E for the LCMO/STO/PMN-PT and (c) LCMO/PMN-PT heterostructures at 300 K.
Temperature dependencies of the in-plane resistances of LCMO film in samples with and without STO at different poling states. The , , and represent unpolarized, positively, and negatively polarized states, respectively. The inset is the schematic diagram of measurement circuit of the LCMO/STO/PMN-PT heterostructure.
(a)-(c) Resistances of the LCMO films in “ON” and “OFF” modes, respectively, as a function of polarization electric fields E applied to PMN-PT single crystal substrate in different temperatures, the arrows indicate the directions of the sweeping E. (d)-(f) Cycled polarization electric fields E dependencies of pure strain induced resistance changes ΔRstrain of LCMO obtained by subtracting data in “OFF” mode from “ON” mode.
Temperature dependencies of ER of the LCMO films for samples with and without STO buffer layer in “ON” and “OFF” modes, respectively. The ER of La0.7Ca0.3MnO3 and La0.8Ca0.2MnO3 films measured in “ON” mode in earlier reports are also indicated as triangle and pentagon, respectively, for comparison.
Article metrics loading...