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Effects of ZnO-nanostructure antireflection coatings on sulfurization-free Cu2ZnSnS4 absorber deposited by single-step co-sputtering process
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10.1063/1.4817253
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    Affiliations:
    1 Department of Electrical Engineering, National Tsing Hua University, Kuang-Fu Road, Hsinchu City, Taiwan
    2 Department of Photonics and Display Institute, National Chiao Tung University, Ta-Hsueh Rd., Hsinchu City, Taiwan
    3 Physics Division, Institute of Nuclear Energy Research, Taoyuan, Taiwan
    a) Author to whom correspondence should be addressed. Electronic mail: ptliu@mail.nctu.edu.tw. Tel.: 886-3-5712121 ext. 52994. FAX: 886-3-5735601. Present address: Department of Photonics and Display Institute, National Chiao Tung University, CPT Building, Room 412, 1001 Ta-Hsueh Rd. Hsin-Chu 300, Taiwan.
    Appl. Phys. Lett. 103, 052904 (2013); http://dx.doi.org/10.1063/1.4817253
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/content/aip/journal/apl/103/5/10.1063/1.4817253
2013-07-30
2014-11-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Effects of ZnO-nanostructure antireflection coatings on sulfurization-free Cu2ZnSnS4 absorber deposited by single-step co-sputtering process
http://aip.metastore.ingenta.com/content/aip/journal/apl/103/5/10.1063/1.4817253
10.1063/1.4817253
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