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SEM images of nickel-coated graphene oxide stripes suspended over a 200 nm deep, 1.4 μm wide trench. (a) Stripes are 20 μm wide and 250 μm long and are spaced by 30 μm. Scale bar: 10 μm. (b) Zoomed image of the edge of a suspended stripe. Scale bar: 750 nm.
(a) Deflection of a 1.8 μm wide and 8.1 nm thick membrane at DC bias of 9 V. Experimental measures (in black crosses) are fitted (red lines) by the linear model (3). (b) Maximum deflection (at the center of the membrane) with respect to DC bias voltage (in black squares). Measurements are fitted (red line) using (3).
In black squares, the estimated thickness of each measured devicewith error bars. In red line, theoretical thickness corresponding to nm.
Bending rigidity of the NiGO stripes deduced from the AFM-measured displacements under electrostatic actuation.
Bending rigidity and thickness of the NiGO stripes.
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