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Anisotropic resistivities in anisotropic-strain-controlled phase-separated La0.67Ca0.33MnO3/NdGaO3(100) films
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View: Figures


Image of FIG. 1.
FIG. 1.

(a) XRD 2 scans of 45 nm as-grown and annealed LCMO/NGO(100) films. The inset shows schematic of the LCMO and NGO unit cells, with the lattice constants and the (420) and (404) diffraction planes denoted. The strain state was analyzed via in-plane lattice mismatches in orthorhombic index. (b) RSMs on (420) and (404) reflections from the 45 nm annealed film, with the open and solid arrows denoting the reflections from the substrate and film, respectively. (c) AFM images (3 × 3 m) from the 15 nm as-grown and annealed films, with the surface height of the annealed film analyzed. (d) AFM and SEM images of the 90 nm annealed films, noting that the [001]-oriented cracks were observed and marked by arrows.

Image of FIG. 2.
FIG. 2.

(a) ZF curves of the 15 and 45 nm as-grown and annealed films. (b)–(d) curves from the 45 nm annealed film in FC-FW, ZFC-FW, and FC(3 T)-ZFW processes, respectively. In (d), the ZFW and FC(3 T) curves were inset for comparison. All the curves were measured with // and //, with solid arrows denoting the cooling/warming processes. The open arrows marked the various phase transition temperatures.

Image of FIG. 3.
FIG. 3.

FC-FW and curves measured from (a) 15 nm, (b) 30 nm, (c) 45 nm, and (d) 60 nm films. The left panel illustrates the current directions with respect to the crystal axes. (e) FC(3 T)-ZFW () curves of the 60 nm film. The ZFC-ZFW curves were also plotted in dash lines for comparison. (f) -dependent AR during FC-FW and FC(3 T)-ZFW.

Image of FIG. 4.
FIG. 4.

(a) loops of the 60 nm film measured after ZFC and FC(3 T) to 70 K with and . (b) RCs on NGO(400) of the 60 nm film at different . The inset shows possible twin structure below , and the PS pattern with [001]-oriented FM filaments (black lines) embedded in the AFI background (blue or light gray).

Image of FIG. 5.
FIG. 5.

(a) FC-FW () curves measured from the 90 nm film at 0, 1.5, and 3 T. (b) The curves normalized by at 320 K. The inset shows schematic of the PS patterns of the 90 nm film. Above , the film only has insulating line cracks (white lines) along [001], and below the [001]-oriented FM filaments (black lines) emerge in the AFI background (blue or light gray).

Image of FIG. 6.
FIG. 6.

(a) Illustrations of Pt electrodes (gray) deposited on the 5 × 5 mm films and of the various and orientations for measurements of AR (solid or green) and AMR (dashed or orange). (b) (FC-)FW - and - curves measured from the 45 nm film at 1.5 T, with along , , or axis. Based on these curves, -dependent AR (c) and AMR (d) were calculated. (e) Top panel: -projected octahedral configurations of the LCMO unit cells. Above (right) the unit cells are orthorhombic with JT-distorted octahedra, while below (left) the shear-mode octahedral deformation leads to a monoclinic domain structure. The schematic PS patterns were also inserted. Bottom panel: schematic of the PS structures. The dark (gray) polygons denote the FM phase at the domain boundaries, and the light polygons denote the AFI phase.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Anisotropic resistivities in anisotropic-strain-controlled phase-separated La0.67Ca0.33MnO3/NdGaO3(100) films