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Electrical conduction mechanism of Zn:SiOx resistance random access memory with supercritical CO2 fluid process
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10.1063/1.4819162
/content/aip/journal/apl/103/8/10.1063/1.4819162
http://aip.metastore.ingenta.com/content/aip/journal/apl/103/8/10.1063/1.4819162
/content/aip/journal/apl/103/8/10.1063/1.4819162
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/content/aip/journal/apl/103/8/10.1063/1.4819162
2013-08-23
2014-07-29
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electrical conduction mechanism of Zn:SiOx resistance random access memory with supercritical CO2 fluid process
http://aip.metastore.ingenta.com/content/aip/journal/apl/103/8/10.1063/1.4819162
10.1063/1.4819162
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