Skip to main content
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
/content/aip/journal/apl/104/25/10.1063/1.4885833
1.
1. R. Gomez-Medina, N. Yamamoto, M. Nakano, and F. J. Garcia de Abajo, New J. Phys. 10, 105009 (2008).
http://dx.doi.org/10.1088/1367-2630/10/10/105009
2.
2. E. J. R. Vesseur, R. de Waele, M. Kuttge, and A. Polman, Nano Lett. 7(9), 2843 (2007).
http://dx.doi.org/10.1021/nl071480w
3.
3. T. Coenen, E. J. R. Vesseur, A. Polman, and A. F. Koenderink, Nano Lett. 11(9), 3779 (2011).
http://dx.doi.org/10.1021/nl201839g
4.
4. M. Kuttge, E. J. R. Vesseur, A. F. Koenderink, H. J. Lezec, H. A. Atwater, F. J. G. de Abajo, and A. Polman, Phys. Rev. B 79(11), 113405 (2009).
http://dx.doi.org/10.1103/PhysRevB.79.113405
5.
5. H. Niioka, T. Furukawa, M. Ichimiya, M. Ashida, T. Araki, and M. Hashimoto, Appl. Phys. Express 4(11), 112402 (2011).
http://dx.doi.org/10.1143/APEX.4.112402
6.
6. D. R. Glenn, H. Zhang, N. Kasthuri, R. Schalek, P. K. Lo, A. S. Trifonov, H. Park, J. W. Lichtman, and R. L. Walsworth, Sci. Rep. 2, 865 (2012).
http://dx.doi.org/10.1038/srep00865
7.
7. J. Goetze and U. Kempe, Mineral. Mag. 72(4), 909 (2008).
http://dx.doi.org/10.1180/minmag.2008.072.4.909
8.
8. F. J. G. de Abajo, Rev. Mod. Phys. 82(1), 209 (2010).
http://dx.doi.org/10.1103/RevModPhys.82.209
9.
9. T. Hu, B. D. Liu, F. Yuan, Z. E. Wang, N. Huang, G. F. Zhang, B. Dierre, N. Hirosaki, T. Sekiguchi, Y. Bando, D. Golberg, and X. Jiang, J. Nanosci. Nanotechnol. 13(8), 5744 (2013).
http://dx.doi.org/10.1166/jnn.2013.7563
10.
10. M. Liu, C. Meng, Z. H. Xue, X. Xiong, D. J. Shu, R. W. Peng, Q. Wu, Z. Hu, and M. Wang, Europhys. Lett. 104(1), 18004 (2013).
http://dx.doi.org/10.1209/0295-5075/104/18004
11.
11. A. Gustafsson, J. Bolinsson, N. Skold, and L. Samuelson, Appl. Phys. Lett. 97(7), 072114 (2010).
http://dx.doi.org/10.1063/1.3473829
12.
12. F. Yuan, B. D. Liu, Z. E. Wang, B. Yang, Y. Yin, B. Dierre, T. Sekiguchi, G. F. Zhang, and X. Jiang, ACS Appl. Mater. Interfaces 5(22), 12066 (2013).
http://dx.doi.org/10.1021/am403876e
13.
13. L. F. Zagonel, L. Rigutti, M. Tchernycheva, G. Jacopin, R. Songmuang, and M. Kociak, Nanotechnology 23(45), 455205 (2012).
http://dx.doi.org/10.1088/0957-4484/23/45/455205
14.
14. A. C. Narvaez, I. G. C. Weppelman, R. J. Moerland, N. Liv, A. C. Zonnevylle, P. Kruit, and J. P. Hoogenboom, Opt. Express 21(24), 29968 (2013).
http://dx.doi.org/10.1364/OE.21.029968
15.
15. A. Gustafsson, K. Hillerich, M. E. Messing, K. Storm, K. A. Dick, K. Deppert, and J. Bolinsson, Nanotechnology 23(26), 265704 (2012).
http://dx.doi.org/10.1088/0957-4484/23/26/265704
16.
16. S. Chen, M. Svedendahl, T. J. Antosiewicz, and M. Käll, ACS Nano 7(10), 8824 (2013).
http://dx.doi.org/10.1021/nn403287a
17.
17. J. Pan, K. He, Z. Chen, and Z. Wang, Opt. Express 18(16), 16722 (2010).
http://dx.doi.org/10.1364/OE.18.016722
18.
18. G. D. Martino, Y. Sonnefraud, S. Kéna-Cohen, M. Tame, S. K Özdemir, M. S. Kim, and S. A. Maier, Nano Lett. 12(5), 2504 (2012).
http://dx.doi.org/10.1021/nl300671w
19.
19. M. L. Juan, M. Righini, and R. Quidant, Nat. Photonics 5(6), 349 (2011).
http://dx.doi.org/10.1038/nphoton.2011.56
20.
20. M. van Lare, F. Lenzmann, M. A. Verschuuren, and A. Polman, Appl. Phys. Lett. 101(22), 221110 (2012).
http://dx.doi.org/10.1063/1.4767997
21.
21. J. Poplawsky and V. Dierolf, Microsc. Microanal. 18(6), 1263 (2012).
http://dx.doi.org/10.1017/S1431927612013499
22.
22. A. C. Zonnevylle, R. F. C. van Tol, N. Liv, A. C. Narvaez, A. P. J. Effting, P. Kruit, and J. P. Hoogenboom, J. Microsc. 252(1), 58 (2013).
http://dx.doi.org/10.1111/jmi.12071
23.
23.See supplemental material at http://dx.doi.org/10.1063/1.4885833 for further illustration of the CL radiative volume dependence on the primary electron energy.[Supplementary Material]
24.
24. P. Chaturvedi, K. H. Hsu, A. Kumar, K. H. Fung, J. C. Mabon, and N. X. Fang, ACS Nano 3(10), 2965 (2009).
http://dx.doi.org/10.1021/nn900571z
25.
25. R. Sapienza, T. Coenen, J. Renger, M. Kuttge, N. F. van Hulst, and A. Polman, Nature Mater. 11(9), 781 (2012).
http://dx.doi.org/10.1038/nmat3402
http://aip.metastore.ingenta.com/content/aip/journal/apl/104/25/10.1063/1.4885833
Loading
/content/aip/journal/apl/104/25/10.1063/1.4885833
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/apl/104/25/10.1063/1.4885833
2014-06-26
2016-09-30

Abstract

Cathodoluminescence (CL) microscopy allows optical characterization of nanostructures at high spatial resolution. At the nanoscale, a main challenge of the technique is related to the background CL generated within the sample substrate. Here, we implement confocal detection of the CL signal to minimize the background contribution to the measurement. Nano-phosphors were used as point sources to evaluate the filtering capabilities of our confocal CL system, obtaining an axial intensity profile with 2.7 m full width at half maximum for the central peak, in good correspondence with theoretical expectations. Considering the electron interaction volume, we found that the confocal filter becomes effective for electron energies above 20 keV, when using a 25 m pinhole (0.86 Airy units). To illustrate our approach, we present confocal CL imaging of gold nanowires and triangular shaped plates deposited on an indium-tin oxide covered glass substrate, comparing the images with those obtained in standard unfiltered CL detection. The results show that confocal CL microscopy is a valuable tool for the investigation of nanostructures on highly cathodoluminescent substrates, widely used in biological and optical applications.

Loading

Full text loading...

/deliver/fulltext/aip/journal/apl/104/25/1.4885833.html;jsessionid=1BJXNw9S7PSHZg7jum7ax47M.x-aip-live-03?itemId=/content/aip/journal/apl/104/25/10.1063/1.4885833&mimeType=html&fmt=ahah&containerItemId=content/aip/journal/apl
true
true

Access Key

  • FFree Content
  • OAOpen Access Content
  • SSubscribed Content
  • TFree Trial Content
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
/content/realmedia?fmt=ahah&adPositionList=
&advertTargetUrl=//oascentral.aip.org/RealMedia/ads/&sitePageValue=apl.aip.org/104/25/10.1063/1.4885833&pageURL=http://scitation.aip.org/content/aip/journal/apl/104/25/10.1063/1.4885833'
x100,x101,x102,x103,
Position1,Position2,Position3,
Right1,Right2,Right3,