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24.See supplementary material at for a 3D rendering of the complex wave field.[Supplementary Material]

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In order to focus light or x rays, the thickness of a refractive lens is typically varied over its aperture. Here, we present a refractive x-ray lens made of lamellae of constant thickness, the refractive lamellar lens. Refractive power is created by a specific bending of the lamellae rather than by a concave lens profile. This very special design has the technological advantage that materials like sapphire or diamond can be used to make lenses by coating techniques. A first lens prototype focused x rays with a photon energy  = 15.25 keV to a lateral beam size of 164 nm × 296 nm full width at half maximum.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd