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/content/aip/journal/apl/105/4/10.1063/1.4891882
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/content/aip/journal/apl/105/4/10.1063/1.4891882
2014-07-30
2016-09-28

Abstract

Based on a two-prong type quartz tuning fork, a force sensor with a high factor, which we call a retuned fork sensor, was developed for non-contact atomic force microscopy (nc-AFM) with atomic resolution. By cutting a small notch and attaching an AFM tip to one prong, its resonance frequency can be retuned to that of the other intact prong. In balancing the two prongs in this manner, a high factor (>50 000 in ultrahigh vacuum) is obtained for the sensor. An atomic resolution image of the Si(111)-7 × 7 surface was demonstrated using an nc-AFM with the sensor. The dependence of the factor on resonance frequency of the sensor and the long-range force between tip and sample were measured and analyzed in view of the various dissipation channels. Dissipation in the signal detection circuit turned out to be mainly limited by the total factor of the nc-AFM system.

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