No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
Comment on “Determination of alloy composition and strain in multiple AlGaN buffer layers in GaN/Si system” [Appl. Phys. Lett. 105
, 232113 (2014)]
3. D. Zhu, C. McAleese, K. K. McLaughlin, M. Häberlen, C. O. Salcianu, E. J. Thrush, M. J. Kappers, W. A. Phillips, P. Lane, D. J. Wallis, T. Martin, M. Astles, S. Thomas, A. Pakes, M. Heuken, and C. J. Humphreys, Proc. SPIE 7231, 723118 (2009).
4. L. Wang, F. Huang, Z. Cui, Q. Wu, W. Liu, C. Zheng, Q. Mao, C. Xiong, and F. Jiang, Mater. Lett. 115, 89 (2014).
6. P. Kidd, XRD of Gallium Nitride and Related Compounds: Strain, Composition and Layer Thickness ( The Analytical X-ray Company, 2009).
Article metrics loading...
There is no abstract available for this article.
Full text loading...
Most read this month