Skip to main content

News about Scitation

In December 2016 Scitation will launch with a new design, enhanced navigation and a much improved user experience.

To ensure a smooth transition, from today, we are temporarily stopping new account registration and single article purchases. If you already have an account you can continue to use the site as normal.

For help or more information please visit our FAQs.

banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
F. Iacopi, M. V. Hove, M. Charles, and K. Endo, MRS Bull. 40, 390 (2015).
M. S. Shur, Solid State Electron. 42, 2131 (1998).
D. R. Hang, C.-T. Liang, C. F. Huang, Y. H. Chang, Y. F. Chen, H. X. Jiang, and J. Y. Lin, Appl. Phys. Lett. 79, 66 (2001).
T. Y. Lin, H. M. Chen, M. S. Tsai, Y. F. Chen, F. F. Fang, C. F. Lin, and G. C. Chi, Phys. Rev. B 58, 13793 (1998).
S. Beyer, S. Löhr, C. Heyn, D. Heitmann, and W. Hansen, Physica E 13, 653 (2002).
M. O. Manasreh, D. W. Fischer, K. R. Evans, and C. E. Stutz, Phys. Rev. B 43, 9772 (1991).
Y. J. Wang, R. Kaplan, H. K. Ng, K. Doverspike, D. K. Gaskill, T. Ikedo, I. Akasaki, and H. Amono, J. Appl. Phys. 79, 8007 (1996).
W. Knap, S. Contreras, H. Alause, C. Skierbiszewski, J. Camassel, M. Dyakonov, J. L. Robert, J. Yang, Q. Chen, M. Asif Khan, M. L. Sadowski, S. Huant, F. H. Yang, M. Goiran, J. Leotin, and M. S. Shur, Appl. Phys. Lett. 70, 2123 (1997).
G. T. Noe II, H. Nojiri, J. Lee, G. L. Woods, J. Léotin, and J. Kono, Rev. Sci. Instrum. 84, 123906 (2013).
D. Molter, F. Ellrich, T. Weinland, S. George, M. Goiran, F. Keilmann, R. Beigang, and J. Léotin, Opt. Express 18, 26163 (2010).
D. Molter, G. Torosyan, G. Ballon, L. Drigo, R. Beigang, and J. Léotin, Opt. Express 20, 5993 (2012).
G. T. Noe II, Q. Zhang, J. Lee, E. Kato, G. L. Woods, H. Nojiri, and J. Kono, Appl. Opt. 53, 5850 (2014).
A. Bartels, F. Hudert, C. Janke, T. Dekorsy, and K. Köhler, Appl. Phys. Lett. 88, 041117 (2006).
X. Wang, “ Time-domain terahertz magneto-spectroscopy of semiconductors,” Ph.D. thesis ( Rice University, 2009).
M. A. Hopkins, R. J. Nicholas, M. A. Brummell, J. J. Harris, and C. T. Foxon, Phys. Rev. B 36, 4789 (1987).
X. Wang, D. J. Hilton, L. Ren, D. M. Mittleman, J. Kono, and J. L. Reno, Opt. Lett. 32, 1845 (2007).
X. Wang, D. J. Hilton, J. L. Reno, D. M. Mittleman, and J. Kono, Opt. Express 18, 12354 (2010).
See supplementary material at for example fits of the complex magneto-conductivity spectra and further details of the GaN electron effective mass non-parabolicity correction.[Supplementary Material]
L. Pfeiffer, K. W. West, H. L. Störmer, and K. W. Baldwin, Appl. Phys. Lett. 55, 1888 (1989).
M. Miyoshi, H. Ishikawa, T. Egawa, K. Asai, M. Mouri, T. Shibata, M. Tanaka, and O. Oda, Appl. Phys. Lett. 85, 1710 (2004).
T. Hofmann, P. Kühne, S. Schöche, J.-T. Chen, U. Forsberg, E. Janzén, N. Ben Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva, Appl. Phys. Lett. 101, 192102 (2012).
S. Syed, J. B. Heroux, Y. J. Wang, M. J. Manfra, R. J. Molnar, and H. L. Stormer, Appl. Phys. Lett. 83, 4553 (2003).

Data & Media loading...


Article metrics loading...



The effective mass, sheet carrier concentration, and mobility of electrons within a two-dimensional electron gas in an AlGaN/GaN heterostructure were determined using a laboratory-based terahertz cyclotron resonance spectrometer. The ability to perform terahertz cyclotron resonance spectroscopy with magnetic fields of up to 31 T was enabled by combining a high-field pulsed magnet with a modified asynchronous optical sampling terahertz detection scheme. This scheme allowed around 100 transmitted terahertz waveforms to be recorded over the 14 ms magnetic field pulse duration. The sheet density and mobility were measured to be 8.0 × 1012 cm−2 and 9000 cm2 V−1 s−1 at 77 K. The in-plane electron effective mass at the band edge was determined to be 0.228 ± 0.002 .


Full text loading...


Access Key

  • FFree Content
  • OAOpen Access Content
  • SSubscribed Content
  • TFree Trial Content
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd