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The Boersch effect in a picosecond pulsed electron beam emitted from a semiconductor photocathode
L. Reimer and H. Kohl, Transmission Electron Microscopy, 5th ed. ( Springer, New York, 2008), p. 38.
A. H. Zewail and M. Thomas, 4D Transmission Electron Microscopy ( Inperial College Press, London, 2009), p. 167.
O. L. Krivanek, T. C. Lovejoy, N. Dellby, T. Aoki, R. W. Carpenter, P. Rz, E. Soignard, J. Zhu, P. E. Batson, M. J. Lagos, R. F. Egerton, and P. A. Crozier, Nature 514, 209–212 (2014).
M. Kuwahara, S. Kusunoki, Y. Nambo, K. Saitoh, X. G. Jin, T. Ujihara, H. Asano, Y. Takeda, and N. Tanaka, Appl. Phys. Lett. 105, 193101 (2014).
L. Nikolova, M. J. Stem, J. M. MacLeod, B. W. Reed, H. Ibrahim, G. H. Campbell, F. Rosei, T. LaGrange, and B. J. Siwick, J. Appl. Phys. 116, 093512 (2014).
M. R. Armstrong, K. Boyden, N. D. Browning, G. H. Campbell, J. D. Colvin, W. J. DeHope, A. M. Frank, D. J. Gibson, F. Hartemann, J. S. Kim, W. E. King, T. B. LaGrange, B. J. Pyke, B. W. Reed, R. M. Shuttlesworth, B. C. Stuart, and B. R. Torralva, Ultramicroscopy 107, 356 (2007).
T. van Oudheusden, E. F. de Jong, S. B. van der Geer, W. P. E. M. Op't Root, O. J. Luiten, and B. J. Siwick, J. Appl. Phys. 102, 093501 (2007).
X. G. Jin, N. Yamamoto, Y. Nakagawa, A. Mano, T. Kato, M. Tanioku, T. Ujihara, Y. Takeda, S. Okumi, M. Yamamoto, T. Nakanishi, T. Saka, H. Horinaka, T. Kato, T. Yasue, and T. Koshikawa, Appl. Phys. Express 1, 045002 (2008).
M. Kuwahara, S. Kusunoki, X. G. Jin, T. Nakanishi, Y. Takeda, K. Saitoh, T. Ujihara, H. Asano, and N. Tanaka, Appl. Phys. Lett. 101, 033102 (2012).
, M. Kuwahara
, S. Kusunoki
, K. Sameshima
, K. Saitoh
, T. Ujihara
, H. Asano
, Y. Takeda
, and N. Tanaka
, AMTC Lett. 4
), available at http://amtc5.com/imges/file/vol4/amtc_4_123.pdf
K. Aulenbacher, J. Schuler, D. V. Harrach, E. Reichert, J. Röthgen, A. Subashev, V. Tioukine, and Y. Yashin, J. Appl. Phys. 92, 7536–7543 (2002).
P. W. Hawkes and H. Kasper, Principles of Electron Optics ( Academic Press, London, 1989), Vol. 2, Chap. 48.
T. Kodama, N. Osakabe, J. Endo, A. Tonomura, K. Ohbayashi, T. Urakami, S. Ohsuka, H. Tsuchiya, Y. Tsuchiya, and Y. Uchikawa, Phys. Rev. A 57, 2781 (1998).
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The space charge effect has been clearly observed in the energy distributions of picosecond pulse beams from a spin-polarized electron microscope, and was found to depend upon the quantity of charge per pulse. The non-linear phenomena associated with this effect have also been replicated in beam simulations that take into account of a three-dimensional space charge. The results show that a charge of 500 aC/pulse provides the highest brightness with a 16-ps pulse duration, a 30-keV beam energy, and an emission spot of 1.8 μm. Furthermore, the degeneracy of the wave packet of the pulsed electron beam has been evaluated to be 1.6 × 10−5 with a charge of 100 aC/pulse, which is higher than that for a continuously emitted electron beam despite the low beam energy of 30 keV. The high degeneracy and high brightness contribute to the realization of high temporal and energy resolutions in low-voltage electron microscopy, which will serve to reduce radiolysis damage and enhance scattering contrast.
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