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Structural analysis of the epitaxial interface Ag/ZnO in hierarchical nanoantennas
J. E. Sanchez, F. Mendoza-Santoyo, J. Cantu-Valle, J. Velazquez-Salazar, M. José Yacaman, F. J. González, R. Diaz de Leon, and A. Ponce, J. Appl. Phys. 117, 034306 (2015).
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D. Alducin, R. Borja, E. Ortega, J. J. Velazquez-Salazar, M. Covarrubias, F. M. Santoyo, L. Bazán-Díaz, J. E. Sanchez, N. Torres, A. Ponce, and M. José-Yacamán, Scr. Mater. 113, 63–67 (2016).
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Detectors, photo-emitter, and other high order radiation devices work under the principle of directionality to enhance the power of emission/transmission in a particular direction. In order to understand such directionality, it is important to study their coupling mechanism of their active elements. In this work, we present a crystalline orientation analysis of ZnO
grown epitaxially on the pentagonal faces of silver nanowires. The analysis of the crystalline orientation at the metal-semiconductor interface (ZnO/Ag) is performed with precession electron diffraction under assisted scanning mode. In addition, high resolution X-ray diffraction on a Bragg-Brentano configuration has been used to identify the crystalline phases of the arrangement between ZnO rods and silver nanowires. The work presented herein provides a fundamental knowledge to understand the metal-semiconductor behavior related to the receiving/transmitting mechanisms of ZnO/Ag nanoantennas.
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