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/content/aip/journal/apl/12/8/10.1063/1.1651974
1.
1.J. F. Delord, K. H. Johnston, R. E. Coovert, B. Pistoulet, C. Roustand, and M. Rouzeyre, Appl. Phys. Letters 11, 287 (1967).
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2.C. A. Mead, J. Appl. Phys. 32, 646 (1961).
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3.J. Cohen, J. Appl. Phys. 33, 1999 (1961).
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4.H. Kanter and W. A. Feibelman, J. Appl. Phys. 33, 3580 (1962).
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5.R. E. Collins and L. W. Davies, Appl. Phys. Letters 2, 213 (1963).
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6.R. M. Handy, J. Appl. Phys. 37, 4620 (1966).
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7.The fact that EL is smaller for forward bias as compared with reverse bias is corroborated by visual observation.
8.
8.Care was taken to measure only on “noiseless” samples, not exhibiting breakdown as discussed previously.1,4 Breakdown causes bursts of light and electrons with widely fluctuating currents many orders of magnitude larger than the emission discussed here.
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/content/aip/journal/apl/12/8/10.1063/1.1651974
2003-10-17
2016-12-07
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