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X‐RAY DYNAMICAL DIFFRACTION EFFECTS OF OXIDE FILMS ON SILICON SUBSTRATES
1.J. R. Patel and B. W. Batterman, J. Appl. Phys. 34, 2716 (1963).
2.I. A. Blech and E. S. Meieran, J. Appl. Phys. 38, 2913 (1967).
2.Strains due to thin metal films on quartz have been observed by x‐ray topography by K. Haruta and W. J. Spencer, J. Appl. Phys. 37, 2232 (1966).
3.N. Kato, J. Phys. Soc. Japan 18, 1785 (1963);
3.N. Kato, J. Phys. Soc. Japan 19, 67 and (1964)., J. Phys. Soc. Jpn.
4.A. R. Lang, Acta Cryst. 12, 249 (1959).
5.Recently G. H. Schwuttke and J. K. Howard, J. Appl. Phys. 39, 1583 (1968) have also observed Pendellosung fringes due to a discontinuous oxide film on silicon.
6.Y. Ando and N. Kato, Acta Cryst. 21, 284 (1966).
7.Equations in the following Letter (“A Computer Calculation of X‐Ray Diffraction Topographs For Distorted Crystals,” N. Kato and J. R. Patel) are referred to by the Roman numeral II.
8.N. Kato, Acta Cryst. 14, 627 (1961).
9.R. J. Jaccodine and W. A. Schlegel, J. Appl. Phys. 37, 2429 (1966).
10.M. V. Whelan, A. H. Goemans, and L. H. C. Goosen, Appl. Phys. Letters 10, 262 (1967).
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