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ELECTROMIGRATION‐INDUCED FAILURES IN ALUMINUM FILM CONDUCTORS
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10.1063/1.1653402
/content/aip/journal/apl/17/7/10.1063/1.1653402
http://aip.metastore.ingenta.com/content/aip/journal/apl/17/7/10.1063/1.1653402
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/content/aip/journal/apl/17/7/10.1063/1.1653402
2003-10-21
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: ELECTROMIGRATION‐INDUCED FAILURES IN ALUMINUM FILM CONDUCTORS
http://aip.metastore.ingenta.com/content/aip/journal/apl/17/7/10.1063/1.1653402
10.1063/1.1653402
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