Full text loading...
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
REFLECTION AND TRANSMISSION SECONDARY EMISSION FROM SILICON
1.R. U. Martinelli, Appl. Phys. Letters 16, 261 (1970).
2.Sample thinning was carried out by W. N. Henry at RCA Electronic Components, Lancaster, Pa.
3.H. E Farnsworth, R. E. Schlier, T. H. George, and R. M. Burger, J. Appl. Phys. 29, 1150 (1958)
Article metrics loading...