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ANNEALING OF ELECTRON‐IRRADIATED CdS
1.The percentages of recovery of n in stages and are approximately the same. It may be speculated that the recovery in stage and that in stage are due to one kind of defect, which is converted from double to single acceptor by moving and making a complex center in stage and converted from single acceptor to neutral one in stage by making another complex center or returning to the undamaged state.
2.T. Yoshida, M. Kitagawa, and T. Fujino, Appl. Phys. Letters 17, 337 (1970).
3.F. L. Vook, Appl. Phys. Letters 13, 25 (1968).
4.K. W. Böer, J. C. O’Connell, and R. Schubert, Proceedings of the International Symposium on Luminescence, Munich, 1965 (Verlag Karl Thiemig KG, Munich, 1966), p. 223.
5.K. W. Böer and J. C. O’Connell, Proceedings of the International Conference on Luminescence, Budapest 1966 (Hungarian Academy of Sciences, Budapest, 1968), p. 1063.
6.R. T. Johnson, Jr., J. Appl. Phys. 39, 3517 (1968).
7.H. B. Im and R. H. Bube, J. Appl. Phys. 39, 2908 (1968).
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