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Scanning X‐Ray Emission Microscopy
1.P. Duncumb, Brit. J. Appl. Phys. 10, 420 (1959).
2.The equipment employed in these experiments consisted of a JSM‐U3 scanning electron microscope (JEOL, Inc., Medford, Mass.) fitted with a Nuclear Diodes Model XS lithium‐drifted silicon x‐ray spectrometer of 235‐eV FWHM resolution (Nuclear Diodes, Inc., Prairie View, Ill.).
3.See, for example, The Electron Microprobe, edited by T. D. McKinley, K. F. J. Heinrich, and D. B. Wittry (Wiley, New York, 1966).
4.A. Rose, Advan. Electron. 1, 131 (1948).
5.G. R. Booker (private communication).
6.D. B. Wittry, J. Appl. Phys. 29, 1543 (1958).
7.G. W. Stroke, M. Halioua, A. J. Saffir, and D. J. Evins, Proceedings of the Fourth Annual Scanning Electron Microscope Symposium, IIT Research Institute, Chicago, Ill., 1971, p. 57 (unpublished).
8.H. C. Andrews, Computer Techniques in Image Processing (Academic, New York, 1970).
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