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Thermally Stimulated Capacitance (TSCAP) in p‐n Junctions
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12.Note added 23 December 1971. After submission of this paper, we received a preprint from Martin G. Buehler [Solid‐State Electron. (to be published)].
12.A detailed analysis using different rates is given for both the TSC and TSCAP methods. Zero biasing the junction to set the initial condition is apparently not employed as in our work. A slightly different temporal sequence of heating is also used recently by J. C. Carballes and J. Varon [Solid‐State Commun. 9, 1627 (1971)] in the TSCAP method.
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