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Direct measurement of flat‐band voltage in MOS by infrared excitation
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10.1063/1.1654340
/content/aip/journal/apl/21/5/10.1063/1.1654340
http://aip.metastore.ingenta.com/content/aip/journal/apl/21/5/10.1063/1.1654340
/content/aip/journal/apl/21/5/10.1063/1.1654340
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/content/aip/journal/apl/21/5/10.1063/1.1654340
2003-10-16
2014-10-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Direct measurement of flat‐band voltage in MOS by infrared excitation
http://aip.metastore.ingenta.com/content/aip/journal/apl/21/5/10.1063/1.1654340
10.1063/1.1654340
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