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Determination of deep energy levels in Si by MOS techniques
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10.1063/1.1654399
/content/aip/journal/apl/21/7/10.1063/1.1654399
http://aip.metastore.ingenta.com/content/aip/journal/apl/21/7/10.1063/1.1654399
/content/aip/journal/apl/21/7/10.1063/1.1654399
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/content/aip/journal/apl/21/7/10.1063/1.1654399
2003-10-16
2014-09-02
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Determination of deep energy levels in Si by MOS techniques
http://aip.metastore.ingenta.com/content/aip/journal/apl/21/7/10.1063/1.1654399
10.1063/1.1654399
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