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The effect of inhomogeneities in acoustic‐surface‐wave amplification
1.B. E. Burke, E. M. Westbrook, and E. Stern, IEEE Ultrasonics Symposium, Miami, Fla., 1971 (unpublished).
2.G. S. Kino and T. M. Reader, IEEE Trans. Electron Devices ED‐18, 909 (1971);
2.B. E. Burke, A. Bers, H. I. Smith, R. A. Cohen, and R. W. Mountain, Proc. IEEE 58, 1775 (1970).
3.T. M. Reader, IEEE Ultrasonics Symposium, San Francisco, Calif., 1970 (unpublished);
3.Stanford University Microwave Laboratory Report No. 1871, Stanford, Calif., 1971 (unpublished).
4.A. Bers in Invited Proceedings 1970 Ultrasonics Symposium, IEEE Publication No. 70‐C‐69‐SU (IEEE, New York, 1971), pp. 138–172.
5.A. Bers and B. E. Burke, Appl. Phys. Letters 16, 300 (1970);
5.A. Bers and B. E. Burke, 17, 47 (1970)., Appl. Phys. Lett.
6.In deriving Eq. (3) the z variation of the transverse field pattern has been neglected. It can be shown that this variation is of higher order in the considered inhomogeneity scale length compared to the acoustic wave length.
7.D. L. White in Proceedings of the 4th International Congress on Acoustics (Acoustical Laboratory, Copenhagen, 1962), pp. 1–3.
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