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The complete base profile shape in a pushed‐out diffused transistor analyzed by radiotracer methods
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10.1063/1.1655401
/content/aip/journal/apl/25/2/10.1063/1.1655401
http://aip.metastore.ingenta.com/content/aip/journal/apl/25/2/10.1063/1.1655401
/content/aip/journal/apl/25/2/10.1063/1.1655401
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/content/aip/journal/apl/25/2/10.1063/1.1655401
2003-10-09
2014-08-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The complete base profile shape in a pushed‐out diffused transistor analyzed by radiotracer methods
http://aip.metastore.ingenta.com/content/aip/journal/apl/25/2/10.1063/1.1655401
10.1063/1.1655401
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