No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
PbS MIS devices for charge‐coupled infrared imaging applications
1.For a review, see D. F. Barbe, Proc. IEEE 63, 38 (1975).
2.For a review, see A. J. Steckl, R. D. Nelson, B. T. French, R. A. Gudmundsen, and D. Schechter, Proc. IEEE 63, 67 (1975).
3.This work was reported in preliminary form at the Device Research Conference, Santa Barbara, Calif., 1974 (unpublished).
4.See, for example, A. K. Jonscher, J. Non‐Cryst. Solids 8–10, 293 (1972).
5.F. J. Leonberger, Ph.D. thesis (MIT, Cambridge, Mass., 1975) (unpublished);
5.F. J. Leonberger, A. L. McWhorter, and T. C. Harman (unpublished).
6.E. H. Nicollian and A. Goetzberger, Bell Syst. Tech. J. 46, 1055 (1967).
7.M. F. Tompsett, IEEE Trans. Electron. Devices ED‐20, 45 (1973).
8.For one such scheme, see E. S. Kohn and M. L. Schultz, Technical Report No. AFCRL‐TR‐74‐0056, 1974 (unpublished).
9.J. P. Donnelly, T. C. Harman, A. G. Foyt, and W. T. Lindley, Solid‐State Electron. 16, 529 (1973).
Article metrics loading...
Full text loading...
Most read this month
Most cited this month