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Elastic compression to 30 kbar along 〈111〉 in shocked LiF
1.Metallurgical Effects at High Strain Rates, edited by R. W. Rohde, B. M. Butcher, J. R. Holland, and C. H. Karnes (Plenum, New York‐London, 1973).
2.Shock Waves and the Mechanical Properties of Solids, edited by J. J. Burke and V. Weiss (Syracuse U.P., New York, 1971).
3.Single‐crystal studies reported in Refs. 1 and 2.
4.J. N. Johnson, O. E. Jones, and T. E. Michaels, J. Appl. Phys. 41, 2330 (1970).
5.P. P. Gillis, K. G. Hoge, and R. J. Wasley, J. Appl. Phys. 42, 2145 (1971).
6.J. R. Asay, G. R. Fowles, G. E. Duvall, M. H. Miles, and R. F. Tinder, J. Appl. Phys. 43, 2132 (1972).
7.J. J. Gilman, Micromechanics of Plastic Flow in Solids (McGraw‐Hill, New York, 1969).
8.J. P. Hirth and J. Lothe, Theory of Dislocations (McGraw‐Hill, New York, 1969).
9.L. E. Pope and A. L. Stevens, in Ref. 1, p. 349.
10.W. J. Murri and G. D. Anderson, J. Appl. Phys. 41, 3521 (1970).
11.J. N. Johnson, J. Appl. Phys. 42, 5522 (1971).
12.J. N. Johnson, J. Appl. Phys. 43, 2074 (1972).
13.J. N. Johnson, J. Phys. Chem. Solids 35, 609 (1974).
14.F. E. Borgnis, Phys. Rev. 98, 1000 (1955).
15.G. E. Duvall, in Stress Waves in Anelastic Solids, edited by W. Prager and H. Kolsky (Springer‐Verlag, Berlin, 1964).
16.For a detailed discussion of slip systems, see Chaps. 8 and 9 in Ref. 8.
17.Y. M. Gupta and G. R. Fowles, in Ref. 1., p. 367;
17.Y. M. Gupta, Ph.D. thesis (Washington State University, 1972), W.S.U. SDL Report 73‐03 (unpublished).
18.In Ref. 17, we have shown a unique relationship to exist between critical resolved shear stress and concentration for LiF crystals air quenched from 400 °C and compressed at strain rates approximately . This graph can then be used to estimate concentrations to within 15%, which compares very well with spectrographic analysis.
19.J. R. Asay and Y. M. Gupta, J. Appl. Phys. 43, 2220 (1972).
20.G. R. Fowles, G. E. Duvall, J. Asay, P. Bellamy, F. Feistman, D. Grady, T. Michaels, and R. Mitchell, Rev. Sci. Instrum. 41, 984 (1970).
21.D. B. Hayes and Y. M. Gupta, Rev. Sci. Instrum. (to be published).
22.We have extensively checked for this electronic dip using a time domain reflectometer sampling and in later shots we used only one oscilloscope to eliminate it. However, if one has to use two oscilloscopes simultaneously as is frequently required in shock work, then either a power divider is needed or oscilloscopes have to be hooked in parallel, which also creates electronic artifacts.
23.W. M. Isbell and D. R. Christman, General Motors Corp. Report MSL‐69‐60 (unpublished).
24.J. J. Gilman and W. G. Johnston, in Solid State Physics, edited by F. Seitz and D. Turnbull (Academic, New York, 1962), Vol. 13.
25.Y. M. Gupta, G. E. Duvall, and G. R. Fowles, J. Appl. Phys. (to be published).
26.Y. M. Gupta (unpublished).
27.G. M. Bartenev and E. G. Koryak‐Doronenko, Phys. Status Solidi 24, 443 (1967).
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